R&D Metrology Scientist - FTIR FTPL of Chemicals & Materials

Role details

Be part of an ever-evolving industry that continues its advancement based on the materials you deliver! GNR has been retained to identify an R&D SCIENTIST / METROLOGIST / PROCESS ENGINEER for a well-established, internationally known, 50\+ year old advanced materials organization.

The Company offers:

• A rewarding & positive culture, offering challenging work & stability.
• Work with some of the brightest chemists and scientists in the world to create the most advanced measurement technologies & systems on the planet!

Reporting directly to the R&D Metrology Director, you’ll play a significant role in the group, mentor team members, coordinate small projects, and expand the boundaries.

• You should have experience with sophisticated measurement processes & technologies to find impurities in the following sectors: Chemical \~ Materials \~ Semiconductor \~ Pharma \~ Biotech

RESPONSIBILITIES & EXPERIENCES SHOULD INCLUDE :

• 8\+ years of experience and a deep knowledge in analytical methods, metrology / measurement development, validation and qualification for a high-reliability manufacturing environments – ISO 17025.
• Subject matter expert & cross-functional leader supporting quality testing, manufacturing operations, new product introduction, and able to resolve customer issues.
• Experienced with FTIR FTPL of Chemical, Materials & Photoluminescence
• Drive METROLOGY technology initiatives and provide key technical input for new equipment & large capital projects.
• MS / PhD Degree in Material Science, Chemistry or Physics
• US Citizen / Perm Resident

LOCATION : *On-site in the SAGINAW, MI region* - Mid-size community with great schools, short commutes, lower cost of living, and enjoy all 4 seasons!

OFFERING : *VERY Attractive compensation package* \= Base \+ Bonus \+ robust relocation assistance

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Keywords & technologies: Fourier Transform Infrared FTIR & Photoluminescence FTPL, SEMI MF1389 MF1391, ISO17025, trace analysis, chemical analysis, trace element, contaminant identification, measurement system analysis (MSA), ICP-OES, ICP-AES, ICP-MS (Inductively Coupled Plasma), Spectrometry (SIM, TXRF, SEM/EDS, AES, XPS, TOS-SIMS, ), atomic absorption spectroscopy, atomic absorption spectroscopy, Gas Chromatography-Mass Spectrometry,